Advanced Analytical Applications and Technical Developments of Soft X-Ray Spectroscopy (#303)
This symposium focuses on advances in analytical applications and technical developments in soft X-ray spectroscopies such as X-ray absorption, fluorescent X-ray emission, photon-in photon-out X-ray scattering, and X-ray photoemission using synchrotron radiation and/or laboratory sources. Soft X-ray spectroscopy is a crucial diagnostic technology in the development of advanced materials, including energy-related materials, nanostructured materials, electronic-device materials, biological materials, soft matter, liquids, foods, and environmentally important materials. On the instrumental side, the field of soft X-ray spectroscopy has also flourished. New developments include in-situ monitoring systems, which allow a better understanding of chemical dynamics, and a push for either high resolution or ultra-fast measurements. New X-ray sources, including X-ray free electron lasers (XFEL), optics, and detector systems, complement the new technology in soft X-ray spectroscopy and allow innovative analytical approaches such as microspectroscopy, three-dimensional imaging, and time-resolved measurements for dynamical diagnostics. In addition to bringing together analytical and physical chemists, X-ray physicists, and material scientists, this symposium will provide an update on the challenges at the frontier of soft X-ray spectroscopy as well as promote analytical applications and technical developments.
Last update: Dec 28, 2015